Transmission Electron Microscopy in Micro-nanoelectronics

Thursday, January 31, 2013

Researchers from CEMES/CNRS, Leti/CEA and STMicroelectronics have written and edited a book presenting in a simple and practical way the new quantitative techniques based on TEM which have recently been invented or developed to address most of the main challenging issues scientist and process engineers have to face to develop and optimize semiconductor devices.

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John Martin (Université de Liège, Belgium) 10 avril 2018, 14h00   In my talk, I...