The new Dual Beam microscope – Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM)–, bought in the frame of the MIMETIS project (EQUIPEX funding) is now fully operational at CEMES. This ensemble, equipped with numerous tools (gas injectors, electron and ion detectors, micromanipulator), allows the observation but also the milling of materials at the nanometer scale and subsequently the creation of artificial structures at this scale. The fabrication of thin foils (between 30 et 400 nm thick) for Transmission Electron Microscopy has already started with a much better precision and throughput. Once installed, a new micro-testing unit will extend the capabilities of the machine. With this feature, unique in France, we should be able to strain micro-and nano-sized objects such as metallic wires, Carbon nanotubes, while observing their mode of deformation.